Substrate
MEMS Prozess
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100mm–300mm Durchmesserbereich
〈100〉·〈111〉·〈110〉 Kristallorientierungen
P / N / Intrinsic Dotierungsarten
SEMI M1–M13 Volle Konformität

Übersicht

Siliziumwafer bleiben das dominierende Substrat — über 90% des globalen Halbleitersubstratmarktes. GINECHIP beschafft und vertreibt Siliziumsubstrate über alle Güteklassen, Durchmesser und Spezifikationen in über 50 Ländern.

Prime-CZ-Wafer, ultraflache FZ-Wafer, SOI-Substrate oder Test-Wafer — unsere Lieferkette liefert konstante Qualität mit voller Rückverfolgbarkeit.

Silicon Wafer Product Categories

Select a category to explore detailed specifications, manufacturing methods, and request a quotation.

Prime Silicon Wafers

Device-grade CZ & FZ substrates. Sub-nanometer roughness, tight resistivity and thickness tolerances for CMOS, MEMS, and power devices.

100–300mm0.001–10,000 Ω·cmEPD < 1/cm²Epi-Ready CMP
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Test / Monitor Wafers

Cost-optimized wafers for fab equipment qualification, process monitoring, and daily tool checks. Consistent electrical and mechanical properties.

100–300mm40–60% cost savingsCustom laser marksEPD < 100/cm²
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Dummy / Mechanical Wafers

Lowest-cost non-production wafers for furnace fill, tool setup, thermal uniformity control, and mechanical handling qualification.

100–300mmLoose specsOxide/Nitride optionsBulk discounts
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Reclaimed Wafers

Chemically-mechanically stripped and repolished wafers restored to near-prime quality. 30–60% cost savings with up to 5 reclaim cycles.

100–300mm30–60% savings< 0.5nm RMSUp to 5 cycles
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Ultra-Thin / Taiko Wafers

Wafers thinned to 20μm with Taiko ring process for 3D-IC stacking, power devices, BSI sensors, and advanced packaging.

20–200μmTTV < 2μmTaiko ring200/300mm
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FZ High-Resistivity Wafers

Float Zone silicon with >10 kΩ·cm resistivity and extreme purity. O₂/C < 5×10¹⁵. Preferred substrate for RFICs, photonics, and radiation detectors.

100–200mm&gt;10 kΩ·cmO₂ &lt; 5×10¹⁵NTD doping
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SOI Wafers

Silicon-on-Insulator substrates with device layer on buried oxide. Smart Cut, BESOI, SIMOX, ELTRAN. For RF-SOI, FD-SOI, MEMS, photonics.

50nm–100μm100nm–4μm BOX200/300mmSmart Cut · BESOI
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Thermal Oxide on Silicon

High-quality thermally-grown SiO₂ layers 10nm–4μm. Dry, wet, and pyrogenic oxidation for gate oxides, diffusion masks, and etch-stop layers.

10nm–4μm SiO₂±1% uniformityDry/Wet/Pyrogenic100–300mm
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Nitride on Silicon (Si₃N₄)

LPCVD & PECVD Si₃N₄ films 20nm–2μm. Stoichiometric and low-stress formulations. Diffusion barrier, passivation, MEMS hard mask.

20nm–2μm Si₃N₄LPCVD/PECVD&lt; 100 MPa stress100–300mm
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Silicon Epi Wafers

CVD homoepitaxial Si on Si. Custom doping and thickness 0.5–200μm. For CMOS sensors, power MOSFETs, IGBTs, and BiCMOS.

0.5–200μm epi±1% uniformityAs/P/B doping100–300mm
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Kristallzuchtverfahren

Wir liefern Substrate aus folgenden Ingot-Zuchtverfahren:

CZ (Czochralski)

Häufigste Methode — Ziehen eines Einkristalls aus Siliziumschmelze. Produziert 200/300-mm-Wafer.

FZ (Float Zone)

Ultrahochreines Silizium durch Zonenschmelzen. Unverzichtbar für IGBTs, HF-Transistoren.

MCZ (Magnetisches CZ)

Magnetfeld während CZ-Wachstum unterdrückt Konvektion. Bevorzugt für CCD/CMOS.

Technische Spezifikationen

ParameterVerfügbarer Bereich
Diameter 100mm (4″), 150mm (6″), 200mm (8″), 300mm (12″)
Type / Dopant P-type (Boron), N-type (Phosphorus, Arsenic, Antimony)
Resistivity 0.001–10,000 Ω·cm (custom ranges available)
Orientation 〈100〉, 〈111〉, 〈110〉 (off-cut angles available)
Thickness 200μm–1000μm (standard SEMI specs ± custom)
Polish SSP (Single-Side), DSP (Double-Side), CMP-finished
Backside Bright-etched, Lapped, Polysilicon, Oxide/Nitride layer
TTV / Bow / Warp As low as < 2μm TTV, < 5μm Bow, < 10μm Warp
Particles ≤ 10 particles @ 0.2μm (Class 1 cleanroom packaging)

Oberflächengüten & Rückseitenbehandlung

Vorderseitenpolitur

  • CMP (Chemical-Mechanical Polish) — sub-nanometer RMS roughness for advanced lithography
  • SSP (Single-Side Polished) — standard for most MEMS and CMOS processes
  • DSP (Double-Side Polished) — required for double-side alignment photolithography
  • Epi-Ready — surface prepared for epitaxial growth with < 5Å native oxide

Rückseitenoptionen

  • Bright-Etched — acid-etched for uniform appearance
  • Lapped — mechanically ground for thickness control
  • Polysilicon Backseal — gettering layer for heavy-metal contamination control
  • Thermal Oxide / LPCVD Nitride — dielectric backside for etch-stop or isolation
  • Custom Backside Film Stacks — oxide-nitride, ONO, or metal backside

Anwendungen

Qualität & Zertifizierung

Jedes Los wird mit Konformitätszertifikat geliefert. ISO 9001:2015.

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ISO 9001:2015 SEMI Standards RoHS Compliant Kundenspezifikationen verfügbar