Photonics LiDAR
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Overview
A comprehensive overview of our capabilities and services.
We deliver industry-leading quality and precision.
H 2Platforms
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H 2Lidar
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H 2Soi Specs
| Parameter | Tbl Standard | Tbl Advanced |
|---|---|---|
| Tbl Device Layer | 220nm ± 5nm | 220nm ± 2nm (or custom) |
| Tbl Box Layer | 2.0μm ± 5% | 2.0μm ± 2% (or 3.0μm) |
| Tbl Handle | 725μm Si (100) | 725μm HR-Si (>1kΩ·cm) |
| Tbl Si Uniformity | < 2nm (1σ) | < 1nm (1σ) |
| Tbl Box Uniformity | < 1% (1σ) | < 0.5% (1σ) |
| Tbl Diameter | 200mm | 200mm, 300mm |
| Tbl Roughness | < 0.2nm RMS | < 0.15nm RMS |
| Tbl Particles | < 20 @ 0.12μm | < 10 @ 0.09μm |
Table Note
H 2Applications
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H 2Waveguide
Silicon and silicon nitride waveguide platforms available with propagation losses as low as 0.5 dB/cm. Single-mode and multi-mode waveguide designs supported. Our photolithography and etching processes achieve vertical sidewalls with roughness below 5nm RMS for low scattering loss.
H 2Epi Quality
Epitaxial layers are characterized by photoluminescence mapping, X-ray diffraction rocking curve analysis, and surface defect density measurement. We guarantee epi-layer uniformity within 2% across the entire wafer, with RMS surface roughness below 0.2nm.
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Contact our engineering team to discuss your specific requirements and receive a detailed quotation within 24 hours.