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100mm – 150mm Diameter
AT / ST / BT-cut Cut Orientation
Q > 10⁶ Q Factor
Frequency Stable Temperature Stability
Single crystal quartz wafers in stock — browse 100–150 mm diameters and cut options now. online store
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Overview

Quartz is a piezoelectric α-SiO₂ crystal, and AT-cut wafers deliver near-zero temperature coefficient at 25°C for strong frequency stability. With Q > 10⁶ (> 2 × 10⁶ in vacuum), they support high-performance oscillators and SAW/BAW devices.

We supply 100–150mm quartz wafers in thicknesses from 100μm–500μm, with RMS < 0.5nm, TTV ≤ 3μm, and Bow ≤ 15μm. Finishes such as SSP/DSP, lapped, and CMP are available, and each wafer ships in a vacuum-sealed single-wafer cassette in Class 100 cleanroom conditions.

AT-cut f ≈ 1,670/t(μm) for frequency calculation, with a near-zero temperature coefficient for stable performance around 25°C.

AT-cut vs. ST-cut

Choose the crystal cut that matches your performance targets. Compare key parameters like turnover temperature, frequency behavior, and SAW/TCD characteristics to optimize oscillators, filters, and timing devices.

AT-cut

AT-cut (35°15′)

Frequency-Stable Oscillator Grade

Turnover Temp ~25°C
Frequency Formula f ≈ 1,670 / t (μm)
k² ~0.11%
Best For Oscillators, Filters

AT-cut offers a near-zero temperature coefficient at ~25°C. f ≈ 1,670 / t (μm); ideal for oscillators and filters.

ST-cut

ST-cut (42°45′)

Zero-TCD SAW Substrate

SAW Velocity ~3,158 m/s
TCD @ 25°C ~0 ppm/°C
k² (SAW) ~0.16%
Best For SAW Filters, Delay Lines

ST-cut delivers SAW velocity ~3,158 m/s and TCD ~0 ppm/°C at 25°C. Best for SAW filters and delay lines.

Hydrothermal Growth & Synthesis

Synthetic quartz grown hydrothermally in autoclaves at high temperature and pressure

Natural quartz mined and swept; both provide single-crystal α-SiO₂ with low defect density

GINECHIP sources and processes wafers with controlled seed orientation for AT/ST/BT/CT/DT/X/Y/Z cuts

Frequency & Temperature Stability

AT-cut cubic frequency-temperature curve, near-zero at 25°C, stability across -20°C to +70°C

Q > 10⁶, up to 2 × 10⁶ in vacuum; low aging for precision timing

SAW & BAW Devices

SAW: ST-cut surface acoustic wave devices, ~3,158 m/s velocity, TCD ~0 ppm/°C

BAW: bulk acoustic wave resonators on AT-cut, fundamental and overtone modes

Frequency range 1 MHz–2.5 GHz covering oscillators, filters, resonators, sensors

Specifications

ParameterAvailable Range / Values
Material Single-crystal α-SiO₂ (Quartz), synthetic or natural
Cut Orientation AT-cut (35°15′), ST-cut (42°45′), BT-cut, CT-cut, DT-cut, X-cut, Y-cut, Z-cut
Diameter 100mm (4″), 150mm (6″)
Thickness 100μm–500μm, frequency-specific lapping
Surface Polish SSP, DSP, lapped, or CMP-finished
Surface Roughness RMS < 0.5nm for polished wafers
TTV ≤ 3μm
Bow / Warp Bow ≤ 15μm
Density 2.65 g/cm³
Piezoelectric Coupling (k²) ≈ 0.11% (AT-cut fundamental mode)
Q-Factor > 10⁶ for AT-cut, > 2 × 10⁶ in vacuum
Temperature Coefficient AT-cut: near-zero at 25°C (cubic frequency-temperature curve)
Frequency Range 1 MHz–2.5 GHz via fundamental and harmonic (overtone) modes
CTE (perpendicular to Z) 13.7 × 10⁻⁶/K
Refractive Index nₒ = 1.544, nₑ = 1.553 @ 589nm
Packaging Vacuum-sealed single-wafer cassette, Class 100 cleanroom

Typical Applications

📶

SAW Filters

ST-cut substrates with ~3,158 m/s SAW velocity and TCD ~0 ppm/°C for band-pass filters and duplexers in mobile and RF front-ends.

⏱️

Oscillators

AT-cut wafers with near-zero temperature coefficient at 25°C and Q > 10⁶ for high-stability clock and reference oscillators.

〰️

BAW Resonators

Bulk acoustic wave resonators on AT-cut in fundamental and overtone modes, 1 MHz–2.5 GHz for timing and filtering.

📡

Sensors

Piezoelectric quartz microbalances and pressure sensors exploiting the stable electromechanical coupling of AT/ST cuts.

⚡

Piezo-MEMS

Thin quartz plates for piezoelectric MEMS resonators, gyroscopes, and energy-harvesting devices with low loss.

🔧

Timing References

Precision frequency references for telecom, GNSS, and data centers requiring low aging and excellent long-term stability.

Metrology & Quality Control

Every GINECHIP quartz wafer is individually inspected. A full metrology report—covering cut orientation, roughness, geometry, resonance, and purity data—accompanies each shipment.

X-Ray Orientation X-ray diffraction verifies AT/ST/BT cut angle accuracy to within ±0.02°.
AFM Surface Roughness Atomic force microscopy confirms RMS < 0.5nm on polished wafers.
Resonance & Impedance Impedance analysis verifies resonant frequency, Q > 10⁶, and motional parameters against design targets.
Flatness & TTV Fizeau interferometry confirms TTV ≤ 3μm and Bow ≤ 15μm on every wafer.
FTIR Analysis FTIR spectroscopy measures OH content and verifies crystal quality for frequency-critical applications.
ICP-MS Purity ICP-MS quantifies trace metal impurities down to ppm levels in synthetic quartz.
Particle Count Laser surface scanning counts particles ≥ 0.3μm, with limits set for Class 100 cleanroom handling.
Alpha Particle Count Alpha-emission screening ensures low soft-error risk for memory-device packaging.

Request a Quartz Wafer Quote

Send your custom specifications—cut orientation, diameter, thickness, and surface finish—and our team will get back with a fast quote tailored to your oscillator, SAW/BAW, and timing applications.

ISO 9001:2015 SEMI MF1530 SEMI M53 IEC 60122-1