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100mm – 300mm Diameter
3.25 ppm/K CTE
525°C Strain Point
Anodic Bond Ready Bonding
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Overview

Borofloat 33 is a borosilicate float glass developed by SCHOTT with a low coefficient of thermal expansion (3.25 × 10⁻⁶/K from 20–300°C) that closely matches silicon. This CTE match, combined with high chemical durability and optical transparency, makes it the material of choice for anodic bonding, microfluidic devices, and through-glass via (TGV) interposers.

We supply Borofloat 33 wafers from 100mm to 300mm diameter in thicknesses from 200μm to 1,100μm, with fire-polished, SSP, DSP, or CMP surface finishes. Every wafer is individually measured and packaged in a Class 100 cleanroom environment.

Borofloat 33 is anodic-bonding ready — its CTE (3.25 × 10⁻⁶/K) matches silicon closely enough for reliable, void-free bonds to Si wafers at 300–450°C.

Borofloat 33 vs. Silicon

For MEMS and microfluidics, Borofloat 33 offers a unique combination that bulk silicon cannot: optical transparency, electrical isolation, and CTE matching to silicon for low-stress wafer bonding.

Glass

Borofloat 33 Glass

CTE-matched to silicon

CTE (20–300°C) 3.25 ppm/K
Strain Point 525°C
Wafer Sizes 100mm – 300mm
Cost $ – $$

CTE 3.25 ppm/K, optically transparent, electrically insulating, hydrolytic Class 1. Ideal for anodic bonding, microfluidics, and optical MEMS where silicon is opaque or conductive.

Silicon

Silicon (Si)

Active-device standard

CTE (20–300°C) 2.6 ppm/K
Optical Opaque (visible)
Wafer Sizes 100mm – 300mm
Cost $$ – $$$

CTE 2.6 ppm/K, opaque in the visible range, electrically conductive, higher cost. Preferred for active electronic devices and high-temperature processing beyond 500°C.

MEMS & Microfluidics

Borofloat 33 supports the three core fabrication steps of glass-based MEMS: isotropic HF etching for microchannels, anodic bonding to silicon capping wafers, and through-glass via formation for 3D interconnects.

Microfluidic Channels

Isotropic HF etching produces smooth, rounded microchannels with well-controlled depth. Borofloat's optical clarity enables direct optical inspection and fluorescence detection through the substrate.

HF Etch Rate ~7 μm/min

Through-Glass Vias

Laser-assisted and plasma-etched via holes are metallized to form high-density vertical interconnects with aspect ratios up to 10:1, enabling 2.5D/3D glass interposers for RF and high-bandwidth applications.

Via Aspect Ratio Up to 10:1

Anodic Bonding Process

Anodic bonding (also called field-assisted or electrostatic bonding) joins Borofloat 33 glass to silicon without adhesives. At 300–450°C with 400–1,000V applied across the stack, oxygen ions migrate toward the silicon interface, forming a permanent Si–O covalent bond.

The result is a strong (> 10 MPa), hermetic, and chemically inert bond. The glass-to-silicon interface is fully transparent to optical inspection, and the bond withstands subsequent dicing, grinding, and wet processing steps.

GINECHIP's anodic bonding service covers substrate cleaning, alignment, and bonding on production equipment with uniform field distribution, supporting wafer sizes from 100mm to 200mm with yield rates optimized for volume manufacturing.

Bio-MEMS & Life Sciences

Borofloat 33 is a preferred substrate for lab-on-chip diagnostics, DNA arrays, and cell-culture devices. Its hydrolytic Class 1 chemical resistance per ISO 719 prevents ionic leaching that could alter pH-sensitive assays, while its transparency enables real-time optical and fluorescence readout.

For cell-based assays, Borofloat's low surface roughness (RMS < 1.0nm) and particle-controlled packaging minimize non-specific binding and background noise, delivering reproducible results across production batches.

Specifications

ParameterAvailable Range / Values
Material Borofloat 33 (SCHOTT), equivalent borosilicate float glass
Diameter 100mm (4″), 150mm (6″), 200mm (8″), 300mm (12″)
Thickness 200μm–1,100μm, standard SEMI thicknesses
CTE (20–300°C) 3.25 × 10⁻⁶/K
Strain Point 525°C
Softening Point 825°C
Density 2.20 g/cm³
Refractive Index n₅₈₉ = 1.4714
Dielectric Constant 4.6 at 1 MHz
Surface Roughness (AFM RMS) < 1.0nm standard
TTV ≤ 5μm
Bow / Warp Bow ≤ 25μm
Transmission Range > 90% from 310nm to 2,700nm
Chemical Resistance Hydrolytic Class 1, Acid Class 1, Alkali Class 2 (per ISO 719 / DIN 12116)
Surface Finish SSP (Single-Side Polish) or DSP (Double-Side Polish), fire-polished or CMP
Packaging Interleaved cleanroom paper, single-wafer cassette, vacuum-sealed

Typical Applications

🧬

Microfluidics

Isotropic HF etching forms smooth microchannels; optical clarity enables fluorescence detection through the substrate.

🔗

Anodic Bonding

CTE-matched to silicon, bonds hermetically to Si wafers at 300–450°C with strengths above 10 MPa.

⚙️

Through-Glass Vias (TGV)

Metallized via holes create high-density vertical interconnects with aspect ratios up to 10:1 for 2.5D/3D glass interposers.

🧪

Electrochemical Devices

Dielectric constant 4.6 at 1 MHz and high purity support electrochemical sensors and micro-electrode arrays.

💉

Biochips & Lab-on-Chip

Hydrolytic Class 1 resistance prevents ionic leaching; transparency enables real-time optical readout for diagnostics.

⚡

Capacitive MEMS

Low dielectric loss and high dimensional stability improve capacitive pressure sensors and accelerometers.

Metrology & Quality Control

Every Borofloat 33 wafer is individually inspected. A full metrology report — including CTE verification, surface roughness, transmission, flatness, and chemical resistance data — accompanies each shipment.

CTE Verification Dilatometry confirms the coefficient of thermal expansion at 3.25 × 10⁻⁶/K (20–300°C) with lot-to-lot consistency for reliable anodic bonding.
AFM Surface Roughness Atomic force microscopy verifies RMS roughness below 1.0nm on polished surfaces, with CMP options available for sub-nanometer finishes.
UV-Vis Transmission Spectrophotometry verifies internal transmission above 90% from 310nm to 2,700nm — including the visible band critical for optical and fluorescence applications.
Flatness & TTV Fizeau interferometry verifies TTV ≤ 5μm and Bow ≤ 25μm on every wafer.
XRF Purity Analysis X-ray fluorescence confirms the composition (SiO₂ ~81%, B₂O₃ ~13%, Na₂O ~4%, Al₂O₃ ~2%) and the absence of trace contamination.
Chemical Durability Testing ISO 719 hydrolytic Class 1, DIN 12116 acid Class 1, and alkali Class 2 verification for compatibility with microfluidic and biomedical media.
Particle Count Laser surface scanning counts particles ≥ 0.3μm, with limits tailored for Class 100 cleanroom packaging.
Contact Angle / Wettability Contact-angle measurement verifies clean, reproducible surface wetting for microchannel filling and wafer bonding.

Request a Borofloat 33 Quote

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ISO 9001:2015 SCHOTT Borofloat 33 ISO 719 (Hydrolytic) SEMI MF1530