8 Process ModulesCore Capabilities
Class 5 CleanroomISO Rating
Fragment–300mmWafer Sizes
R&D to PilotVolume Flexibility

Overview

Managing a MEMS or semiconductor fabrication flow across multiple vendors introduces significant complexity: process qualification at each supplier, wafer logistics and shipping delays, interface compatibility risks between process steps, and inconsistent quality documentation. GINECHIP's integrated process services model collapses this multi-vendor supply chain into a single, seamless workflow.

Our eight core process modules — thin-film deposition, photolithography, DRIE etching, wafer bonding, wafer bumping, wafer reclaim, wet/vapor etching, and CMP — are operated under one quality management system in ISO Class 5 cleanroom conditions. This enables reduced cycle time (no inter-vendor shipping), single-source accountability (one Certificate of Conformance covering the entire process flow), and optimized process integration (our engineers ensure each step is compatible with downstream requirements).

Process Modules

Thin-Film Deposition

Complete thin-film deposition services for MEMS and semiconductor wafers. PVD sputtering (DC, RF, magnetron, reactive), e-beam and thermal evaporation, PECVD, LPCVD, ALD, and electroplating. Metals (Al, Ti, Au, Pt, Cu, Cr, Ni), dielectrics (SiO₂, Si₃N₄, Al₂O₃, HfO₂), semiconductors (poly-Si, a-Si), and polymers (polyimide, BCB, parylene).

PVD, CVD, ALD, ECD1nm–100μm thicknessMetals, dielectrics, polymers100mm–300mm wafers

Photolithography

Precision wafer patterning using five distinct exposure technologies. Contact and proximity lithography (0.5–5μm), i-line projection stepper (0.35μm), maskless laser direct write (0.6μm), and nanoimprint lithography (< 50nm). Full resist processing including coat, soft/hard bake, develop, and descum. Double-side alignment capability.

5 technologies0.35μm resolution (stepper)Maskless direct write optionDouble-side alignment

DRIE — Deep Reactive Ion Etching

High-aspect-ratio silicon etching via Bosch process (SF₆/C₄F₈交替 cycles) for MEMS structures. Aspect ratios exceeding 30:1 with vertical sidewall profiles (89° ± 0.5°). Through-wafer etching for TSVs and membrane release. Cryogenic and non-Bosch processes available for smooth sidewall applications.

Aspect ratio > 30:1Through-wafer capabilitySOI device layer releaseScallop control < 50nm

Wafer Bonding

Permanent and temporary wafer bonding technologies for MEMS encapsulation and 3D stacking. Anodic bonding (Si-glass, 300–500°C), fusion bonding (Si-Si, Si-SiO₂, high-temp anneal), eutectic bonding (Au-Si 363°C, AuSn 280°C), adhesive bonding (BCB, SU-8, epoxy). Wafer-level hermetic sealing for vacuum-packaged devices.

Anodic, fusion, eutectic, adhesiveWafer-level hermetic sealVacuum < 1 mTorr achievableAlignment accuracy < 2μm

Wafer Bumping &amp; UBM

Wafer-level interconnect formation for flip-chip and 3D stacking. Solder bumps (SnAg, SAC, AuSn), Cu pillars (20–80μm pitch), Au stud bumps (fluxless, clean process), and micro-bumps (10–55μm pitch). Full UBM metallization stacks: Ti/Cu, TiW/Cu, Cr/CrCu/Cu, electroless Ni/Au.

Solder, Cu pillar, Au studPitch: 10μm–400μm6 standard UBM stacksAOI + shear testing

Wafer Reclaim &amp; Reprocessing

Restore used test and monitor wafers to virgin-grade surface quality. Selective chemical stripping of films (oxide, nitride, metal, resist), CMP re-polishing to Ra < 0.5nm, and full metrology re-certification. Silicon, SOI, glass, and GaAs substrates up to 300mm. Reduce wafer procurement costs by up to 70%.

Up to 70% cost savings3–5 reclaim cycles typicalRa < 0.5nm post-polishSi, SOI, glass, GaAs

Wet &amp; Vapor Etching

Isotropic and anisotropic chemical etching for MEMS structure release and surface preparation. KOH (anisotropic Si, 〈111〉 etch stop), TMAH (CMOS-compatible), BOE/HF (oxide etch and sacrificial release), H₃PO₄ (nitride strip). HF vapor etching for stiction-free sacrificial oxide release of suspended microstructures. Critical point drying (CPD) available.

KOH, TMAH, BOE/HF, H₃PO₄HF vapor (stiction-free)CPD drying availableSelectivity > 100:1 (some pairs)

CMP — Chemical Mechanical Polishing

Planarization and surface finishing for multi-level MEMS structures. Oxide CMP (ILD planarization), tungsten CMP (via plugs), copper CMP (damascene RDL), and silicon CMP (surface preparation). Sub-nanometer RMS surface finish with tight within-wafer uniformity (< 2% 1σ).

Oxide, W, Cu, Si CMPRa < 0.5nm achievableWIW uniformity < 2%Post-CMP clean (brush + mega)

Fab Capabilities at a Glance

Capability AreaDetails
Cleanroom ClassISO Class 5 (Class 100) for lithography; ISO Class 6 (Class 1,000) for wet processing and CMP
Wafer SizesFragments, 100mm (4″), 150mm (6″), 200mm (8″), 300mm (12″). Multi-size cassette compatibility.
Substrate MaterialsSilicon (CZ, FZ, all grades), SOI, glass (fused silica, borosilicate, quartz), GaAs, InP, SiC, sapphire, ceramics
Metrology SuiteSEM, AFM, spectroscopic ellipsometry, 4-point probe, optical profilometry, laser surface scanner, XRD, contact angle goniometer
Data FormatsGDSII, OASIS, DXF, CIF for lithography. Standardized process travelers with full lot traceability.
Process ControlSPC (statistical process control) on critical parameters. Run-to-run thickness and CD control. Monthly process capability reports.
CertificationsISO 9001:2015 certified quality management. SEMI Standards compliance. ITAR registered for defense-related work.
Volume CapabilitySingle-wafer R&amp;D up to pilot production volumes (hundreds of wafers/month). Flexible scheduling for academic and startup timelines.

End-to-End Process Integration

What differentiates GINECHIP from single-process vendors is our ability to manage multi-step, multi-module process flows as an integrated service. A typical MEMS accelerometer fabrication flow — for example — might include: substrate preparation (Si or SOI wafer supply) → PVD electrode deposition (Ti/Au) → photolithography (comb-drive patterning) → DRIE (silicon etch for proof mass release) → wet etch (sacrificial oxide removal + CPD) → wafer bonding (hermetic cap seal with TSV feedthrough) → wafer-level electrical test → dicing.

Instead of managing five different vendors across three countries, our customers receive a single project plan, a single process traveler, and a single Certificate of Conformance. Our process engineers act as your virtual fab integration team — anticipating interface issues, optimizing process parameters holistically, and delivering finished devices ready for packaging and test.

Custom Process Development

Not every process step is off-the-shelf. For customers developing novel MEMS devices with unique material stacks, non-standard geometries, or emerging process requirements, we offer custom process development services. This includes: design-of-experiments (DOE) to optimize individual process parameters, split-lot processing for A/B comparison, process window characterization (center-point and edge-of-window verification), and full process documentation for technology transfer to volume manufacturing.

From Prototype to Production

Our process services are designed to scale with you. Start with single-wafer engineering runs for feasibility demonstration and design validation. Move to small-batch prototyping (5–25 wafers) for yield optimization and reliability testing. Transition to pilot production (50–200 wafers/month) with SPC-controlled processes and established baseline yields. Throughout this journey, process parameters and quality specifications remain consistent — eliminating the costly re-qualification that often accompanies vendor transitions between development and production phases.

Ready to Streamline Your Process Flow?

Share your process sequence, wafer specifications, and target volume — our engineering team will design an integrated process plan and provide a comprehensive quotation within 24 hours.

ISO 9001:2015 Class 5 Cleanroom ITAR Registered Single-Source