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60–80%Cost vs. Prime
Si · SiO₂ · Glass · Al₂O₃Material Options
Die to 300mm WaferFormats Available
Custom GeometriesCustomization

Overview

Dummy (or mechanical) dies are non-functional silicon or glass chips that replicate the physical dimensions, weight, and mechanical properties of functional ICs. They are essential for package development, assembly process qualification, wire bonding calibration, and reliability testing — allowing engineers to verify processes without risking expensive functional devices.

GINECHIP fabricates dummy dies from silicon, glass, ceramic, and metal-coated substrates with precise dimensional control (±5μm tolerance). Available as singulated dies, wafer-form, or custom geometries with optional surface metallization for wire bonding or flip-chip assembly studies.

Product Range

Bare Silicon Dummy Dies

Non-patterned, low-grade silicon wafers or dies for general mechanical testing, process development, and handling trials.

Diameters: 100mm–300mmP-type or N-type (loose spec)Thickness: 200μm–1000μmAs-cut, lapped, or etched surfaceCassette quantity availableCost: 60–80% less than prime

Oxide-Coated Dummy Dies

Thermal oxide (100nm–2μm SiO₂) coated wafers or dies. Used for adhesion studies, surface energy characterization, and dielectric breakdown testing.

Oxide: 100nm–2μm thermal SiO₂Diameters: 100mm–300mmDry or wet oxidationUniformity: < 5% (relaxed spec)Backside: etched or polishedMulti-cycle usable

Custom-Size Dummy Dies

Dies fabricated to your exact X/Y dimensions and thickness specifications. Ideal for replicating specific IC package outlines for thermal simulation and assembly tooling qualification.

Die sizes: 2×2mm to 25×25mmThickness: 100μm–725μmSingulation: blade or stealth dicingBackside: lapped or polishedQuantity: 100–10,000+Custom sizes available

Metallized Dummy Dies

Dies with Al, Au, or Cu pad metallization for wire bonding or flip-chip process development. Pad layout from your GDSII file or standard patterns.

Metal: Al (1μm) or Ti/AuPad pitch: 50–300μmPad opening: 40–150μmDie size: customPassivation: optional SiN or SiO₂GDSII layout accepted

Glass & Ceramic Dummy Dies

Non-silicon dummy substrates. Glass dies for optical package development and transparent assembly observation. Ceramic dies (Al₂O₃, AlN) for high-temperature processes.

Glass: borosilicate, soda-limeCeramic: Al₂O₃ (96%, 99.6%)AlN: 170–230 W/m·KThickness: 200μm–1mmFormat: wafer or couponMetal coating optional

Special-Shape Dies & Coupons

Custom geometries including notched dies, T-shaped coupons, multi-thickness wafers, and fragment pieces for specific test fixtures. Drawing-based fabrication with ±25μm tolerance.

Custom geometries availableThrough-holes, slots, notchesMulti-thickness wafersMetal patterns (alignment marks)Fragment sizes: 5×5mm to 50×50mmDrawing-based fabrication

Common Applications

Wire Bonding Process Development

Optimize ultrasonic power, bond force, time, and temperature parameters on non-critical dies before processing expensive functional devices.

Flip-Chip Assembly Qualification

Validate underfill flow, reflow profiles, and co-planarity requirements using metallized dummy dies before committing to functional flip-chip devices.

Thermal Interface Material (TIM) Testing

Evaluate thermal paste, grease, or phase-change material performance under controlled conditions using standardized dummy die dimensions.

Mechanical Stress & Drop Testing

Use dummy dies in board-level reliability testing, 3-point bend tests, and drop/shock testing without consuming functional inventory.

Assembly Line Setup & Training

Qualify new pick-and-place equipment, die attach processes, and train operators using low-cost dummy dies before transitioning to production.

X-Ray & CSAM Inspection Calibration

Use dummy die assemblies with known intentional defects to calibrate and validate X-ray, CSAM, and other NDT inspection systems.

Cost-Benefit Analysis

Direct Cost Comparison

Dummy dies typically cost 60–80% less than functional prime-grade dies of equivalent dimensions. For a packaging R&D team consuming 500+ dies per month during process development, the annual savings can exceed $50,000–$200,000 depending on die complexity and material.

Total Cost of Ownership

Beyond die cost, dummy dies eliminate the hidden costs of consuming functional inventory: lost revenue from scrapped devices, re-qualification overhead when inventory runs out, and schedule delays from waiting for replacement functional wafers.

Fabrication Design Support

Submit your die dimensions (X, Y, Z), material choice, surface finish requirements, and any special features. Our team reviews your request and provides a DFM assessment with a detailed quotation within 24 hours. We accept DXF, DWG, GDSII, and step files for custom geometries.

Quality Assurance

All dummy dies undergo dimensional inspection (optical metrology, ±5μm tolerance), visual inspection (surface defects, edge chipping), surface roughness verification (if specified), and cleanliness certification (particle count per IEST-STD-CC1246). Full lot traceability maintained from raw material to final shipment.

Need Dummy Dies for Your Packaging Development?

Tell us your die dimensions, material, surface finish, and quantity — we'll provide a competitive quote with delivery timeline within 24 hours.

ISO 9001:2015 Cleanroom Fabrication Full Lot Traceability DFM Review Included