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Wide-Bandgap PlatformTechnology
SiC / GaNResolution
100mm–200mmCapacity
ISO 9001:2015Certification

Overview

Wide-bandgap semiconductors — SiC and GaN — are transforming power electronics. GINECHIP supplies high-quality SiC and GaN substrates for high-voltage, high-frequency applications ranging from EV traction inverters to data center power supplies, screened to the lowest defect densities for maximum reliability.

We deliver industry-leading quality and precision — every wide-bandgap substrate ships with full material certification and lot traceability.

SiC Devices

SiC Power MOSFETs

High-voltage SiC power MOSFETs deliver low on-resistance and fast switching for 650V–3.3kV applications, with planar or trench gate architectures optimized for EV and industrial power conversion.

Voltage: 650V, 1200V, 1700V, 3.3kVRDS(on): 15–80 mΩ (1200V)Tj(max): 175–200°CGate: planar or trenchBody diode: low Vf, fast recoveryDiameters: 100mm, 150mm

SiC Schottky & JBS Diodes

Unipolar SiC Schottky and junction-barrier Schottky (JBS) diodes offer near-zero reverse recovery charge and rugged surge capability, enabling higher switching frequencies and smaller passive components.

Voltage: 650V, 1200V, 1700VCurrent: 2A–50A+ (per die)Qrr: near-zeroVf: 1.5V (typical @ rated I)Surge: 10× rated (MPS structure)JBS or MPS architectures

SiC Power Modules

Half-bridge and six-pack SiC power modules integrate multiple die on AlN or Si₃N₄ direct-bonded copper substrates for high power density inverters from 10kW to 300kW+.

Power: 10kW–300kW+Topology: half-bridge, 6-packBaseplate: AlSiC, CuSubstrate: AlN DBC, Si₃N₄ AMBCooling: liquid or forced airGate driver integration support

GaN Devices

GaN Power HEMTs (E-Mode)

Enhancement-mode p-GaN HEMTs on 200mm silicon combine ultra-low gate charge with megahertz-class switching, cutting conduction and switching losses in compact 100V and 650V power stages.

Voltage: 100V, 650VRDS(on): 15–200 mΩQg: 1–10 nC (extremely low)Switching: >1 MHz capableGate: p-GaN e-modeWafer: 200mm Si (111)

Vertical GaN Power Devices (R&D)

Vertical and lateral CAVET structures on semi-insulating 4H-SiC target next-generation 1.2kV–10kV blocking voltages, leveraging SiC's thermal conductivity for high-current R&D device development.

Voltage: 1.2kV–10kV (R&D)Substrate: semi-insulating 4H-SiCVertical or lateral CAVETCurrent: 1–50A (development)Thermal: 4.9 W/cm·K (SiC)Diameter: 100mm, 150mm

GaN Power ICs

Monolithically integrated GaN power ICs combine FET, gate driver, and protection circuitry in a single die, enabling switching up to 10MHz for compact 48V–650V power converters.

Integration: FET + driver + protectionTopology: half-bridge, full-bridgeSwitching: up to 10 MHzVoltage: 48V–650VProtection: OCP, OTP, UVLOPackage: WLCSP, QFN

Material Comparison

PropertySiSiCGaN
Bandgap (eV)1.123.263.39
Critical E-Field (MV/cm)0.32.83.3
Electron Mobility (cm²/V·s)1,4001,0001,250 (bulk) / 2,000 (2DEG)
Thermal Conductivity (W/cm·K)1.54.91.3 (bulk) / 4.9 (on SiC)
Baliga Figure of Merit1340870
Max Junction Temp (°C)150–175200–250200–250
Wafer Diameter200mm, 300mm150mm, 200mm200mm (on Si)

Specifications above are based on standard products. Custom specifications available upon request.

Applications

EV Traction Inverters & On-Board Chargers

SiC MOSFETs reduce switching losses in traction inverters and OBCs, extending EV range and shrinking thermal management systems.

DC Fast-Charging Infrastructure

High-voltage SiC devices enable compact, high-efficiency power stages for 350kW+ DC fast-charging stations.

Data Center & Server Power Supplies

GaN and SiC power devices raise PSU efficiency and power density, reducing energy costs and cooling requirements in hyperscale data centers.

Solar & Renewable Energy Inverters

Wide-bandgap devices improve conversion efficiency and reduce passive component size in string and central solar inverters.

Industrial Motor Drives & Automation

SiC-based drives deliver higher switching frequencies and torque control precision for industrial motors and robotics.

5G Telecom & Grid Infrastructure Power

GaN power stages support compact, high-efficiency base station and grid-edge power conversion for next-generation telecom infrastructure.

Substrate Quality

Our power-electronics-grade substrates feature superior surface quality with < 5 particles at 0.2μm, TTV < 2μm, and surface roughness < 0.2nm RMS. These specifications are critical for low-defect-density epitaxial growth and high device yield.

All substrates undergo rigorous incoming inspection including AFM surface roughness measurement, spectroscopic ellipsometry for film thickness verification, and laser particle scanning. Certificates of conformance are provided with each shipment.

Reliability

Environmental reliability testing includes temperature cycling, HAST, high-temperature storage, and mechanical shock per MIL-STD and JEDEC standards. Bonded wafer pairs are qualified for your application-specific environmental conditions.

Ready to Get Started?

Contact our engineering team to discuss your specific requirements and receive a detailed quotation within 24 hours.

ISO 9001 Certified Wide-Bandgap Materials Epi-Ready Surface 24-Hour Response