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< 100μmTarget Wafer Thickness
200mm · 300mmWafer Compatibility
< 20μmFlatness Precision
Vacuum-CompatibleDesign Type

Overview

As device manufacturers push toward 3D-IC stacking, power device thinning, and backside-illuminated sensors, wafer thicknesses below 100μm — and in advanced cases below 50μm — have become routine, yet these wafers are extraordinarily fragile and prone to warpage once ground below their native mechanical stiffness threshold. Thin-wafer support frames provide a rigid, vacuum-compatible interface that distributes handling forces evenly across the wafer edge, preventing the localized stress concentrations that cause cracking during transport, backgrinding, and dicing.

GINECHIP's thin-wafer support frames maintain flatness below 20μm across the full frame diameter, with optional carrier plate configurations that provide full-back-surface support for the most fragile process steps, such as post-backgrind wafer bonding and Taiko ring debonding. Vacuum-compatible seal surfaces ensure reliable chucking on downstream lithography, inspection, and bonding equipment without introducing particulate contamination.

Technical Specifications

ParameterAvailable Range / Values
Target Wafer Thickness< 100μm (down to 20μm with Taiko-style edge support)
Wafer Compatibility200mm (8″), 300mm (12″)
Design TypeVacuum-compatible chuck-mount frames, carrier plate options
Flatness< 20μm precision flatness across support surface
Warpage ControlAnti-warpage rim support for post-backgrind handling
MaterialStainless steel or reinforced composite, chemical-resistant coatings
Compatible ProcessesBackgrinding, dicing, die attach, wafer bonding/debonding
StandardsSEMI G74, SEMI G87 compatible geometries

Applications

Backgrinding & Wafer Thinning

Rigid frame support during and after grinding prevents wafer flex that causes micro-cracking in wafers thinned below 100μm.

3D-IC & TSV Stacking

Ultra-thin die stacks for through-silicon-via integration require dimensionally stable carrier support through multiple bonding and alignment steps.

Power Device Thinning

IGBT and MOSFET backside processing requires thin-wafer handling frames that maintain flatness through backside metallization steps.

BSI Image Sensor Fabrication

Backside-illuminated sensor wafers thinned for optical performance require carrier-plate-supported frames throughout the process flow.

Quality & Certification

Flatness of every thin-wafer support frame is verified via interferometry against a <20μm specification prior to shipment, under ISO 9001:2015 certified quality management. Vacuum seal integrity is leak-tested to ensure reliable chucking performance across repeated use cycles.

Need Thin-Wafer Support Frames?

Tell us your target wafer thickness and process step (backgrind, dicing, bonding) — our engineers will recommend the right frame and carrier plate configuration.

ISO 9001:2015 < 20μm Flatness Vacuum-Compatible Carrier Plate Options