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100mm – 150mm singleCrystalQuartzSub.statLabelDiameter

AT / ST / BT-cut singleCrystalQuartzSub.statLabelCut

Q > 10⁶ singleCrystalQuartzSub.statLabelQFactor

Frequency Stable singleCrystalQuartzSub.statLabelTempStab

singleCrystalQuartzSub.heading1

singleCrystalQuartzSub.overviewP1

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singleCrystalQuartzSub.cutComparisonDesc

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AT-cut (35°15′)

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Turnover Temp ~25°C

Frequency Formula f ≈ 1,670 / t (μm)

k² ~0.11%

Best For Oscillators, Filters

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ST-cut (42°45′)

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SAW Velocity ~3,158 m/s

TCD @ 25°C ~0 ppm/°C

k² (SAW) ~0.16%

Best For SAW Filters, Delay Lines

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singleCrystalQuartzSub.freqTempP1

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singleCrystalQuartzSub.sawBawP1

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Parameter	Available Range / Values
Material	Single-crystal α-SiO₂ (Quartz), synthetic or natural
Cut Orientation	AT-cut (35°15′), ST-cut (42°45′), BT-cut, CT-cut, DT-cut, X-cut, Y-cut, Z-cut
Diameter	100mm (4″), 150mm (6″)
Thickness	100μm–500μm, frequency-specific lapping
Surface Polish	SSP, DSP, lapped, or CMP-finished
Surface Roughness	RMS < 0.5nm for polished wafers
TTV	≤ 3μm
Bow / Warp	Bow ≤ 15μm
Density	2.65 g/cm³
Piezoelectric Coupling (k²)	≈ 0.11% (AT-cut fundamental mode)
Q-Factor	> 10⁶ for AT-cut, > 2 × 10⁶ in vacuum
Temperature Coefficient	AT-cut: near-zero at 25°C (cubic frequency-temperature curve)
Frequency Range	1 MHz–2.5 GHz via fundamental and harmonic (overtone) modes
CTE (perpendicular to Z)	13.7 × 10⁻⁶/K
Refractive Index	nₒ = 1.544, nₑ = 1.553 @ 589nm
Packaging	Vacuum-sealed single-wafer cassette, Class 100 cleanroom

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📶

singleCrystalQuartzSub.appSawFilters

singleCrystalQuartzSub.appSawFiltersDesc

⏱️

singleCrystalQuartzSub.appOscillators

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〰️

singleCrystalQuartzSub.appBawResonators

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📡

singleCrystalQuartzSub.appSensors

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⚡

singleCrystalQuartzSub.appPiezoMems

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🔧

singleCrystalQuartzSub.appTimingRefs

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singleCrystalQuartzSub.heading8

singleCrystalQuartzSub.metrologyDesc

singleCrystalQuartzSub.metrologyXray singleCrystalQuartzSub.metrologyXrayDesc

singleCrystalQuartzSub.metrologyAfm singleCrystalQuartzSub.metrologyAfmDesc

singleCrystalQuartzSub.metrologyImpedance singleCrystalQuartzSub.metrologyImpedanceDesc

singleCrystalQuartzSub.metrologyInterferometry singleCrystalQuartzSub.metrologyInterferometryDesc

singleCrystalQuartzSub.metrologyFtir singleCrystalQuartzSub.metrologyFtirDesc

singleCrystalQuartzSub.metrologyIcpms singleCrystalQuartzSub.metrologyIcpmsDesc

singleCrystalQuartzSub.metrologyParticle singleCrystalQuartzSub.metrologyParticleDesc

singleCrystalQuartzSub.metrologyAlpha singleCrystalQuartzSub.metrologyAlphaDesc

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ISO 9001:2015 SEMI MF1530 SEMI M53 IEC 60122-1

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