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2″ – 8″ sapphireAl2o3Sub.statLabelDiameter
C / R / A / M-plane sapphireAl2o3Sub.statLabelOrientation
9 Mohs sapphireAl2o3Sub.statLabelHardness
2,040°C sapphireAl2o3Sub.statLabelMeltingPoint
sapphireAl2o3Sub.shopBannerText sapphireAl2o3Sub.shopBannerShop
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Kyropoulos (KY)

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Boule Diameter Up to 300mm
EPD < 5 × 10³/cm²
Best Orientation C-plane (0001)
Cost $ – $$

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Edge-Defined Film-Fed (EFG)

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Typical Width Up to 150mm ribbon
EPD < 1 × 10⁴/cm²
Best Orientation R-plane, A-plane
Cost $$

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Heat Exchanger Method (HEM)

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Boule Weight Up to 200 kg
EPD < 10³/cm²
Best For Optics, Armor, Lasers
Cost $$$

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sapphireAl2o3Sub.primaryUse sapphireAl2o3Sub.cplaneStat

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sapphireAl2o3Sub.primaryUse sapphireAl2o3Sub.aplaneStat

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ParameterAvailable Range / Values
Material Single-crystal α-Al₂O₃ (Sapphire), various grades
Crystal Orientation C-plane (0001), R-plane (1-102), A-plane (11-20), M-plane (10-10)
Diameter 2″ (50.8mm), 3″ (76.2mm), 4″ (100mm), 6″ (150mm), 8″ (200mm)
Thickness 330μm, 430μm, 650μm, 1,000μm standard
Surface Polish SSP, DSP, Epi-Ready CMP, RMS < 2Å
TTV ≤ 5μm
Bow / Warp Bow ≤ 10μm, Warp ≤ 15μm for 4″ diameter
EPD (Etch Pit Density) < 5 × 10³/cm²
Hardness 9 Mohs, 2,000 kg/mm² Knoop
Thermal Conductivity 40 W/m·K @ 300K
CTE 5.0–6.6 × 10⁻⁶/K (anisotropic, orientation-dependent)
Melting Point 2,040°C
Bandgap 9.9 eV (wide-bandgap optical insulator)
Refractive Index nₒ = 1.768, nₑ = 1.760 @ 633nm
Transmission Range 150nm–5,500nm (UV-grade: 85% @ 250nm)
Miscut Tolerance ±0.2° standard, ±0.05° precision
Packaging Class 100 cleanroom, vacuum-sealed single-wafer cassette

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sapphireAl2o3Sub.appSos

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sapphireAl2o3Sub.appPss

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sapphireAl2o3Sub.appRfMicrowave

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sapphireAl2o3Sub.metrologyXrd sapphireAl2o3Sub.metrologyXrdDesc
sapphireAl2o3Sub.metrologyAfm sapphireAl2o3Sub.metrologyAfmDesc
sapphireAl2o3Sub.metrologyEpd sapphireAl2o3Sub.metrologyEpdDesc
sapphireAl2o3Sub.metrologyInterferometry sapphireAl2o3Sub.metrologyInterferometryDesc
sapphireAl2o3Sub.metrologySpectrophotometry sapphireAl2o3Sub.metrologySpectrophotometryDesc
sapphireAl2o3Sub.metrologyXrayOrientation sapphireAl2o3Sub.metrologyXrayOrientationDesc
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ISO 9001:2015 SEMI MF1530 ASTM F47 (EPD) SEMI MF1810