기판
MEMS 프로세스
재처리
부속품
자원
기술 기사
회사
가게
100mm – 300mm fusedSilicaQuartzSub.statLabelDiameter
> 90% @ 185nm fusedSilicaQuartzSub.statLabelUvTransmission
0.55 ppm/K fusedSilicaQuartzSub.statLabelCte
< 0.5nm RMS fusedSilicaQuartzSub.statLabelRoughness
fusedSilicaQuartzSub.shopBannerText fusedSilicaQuartzSub.shopBannerShop
fusedSilicaQuartzSub.shopBannerBtn

fusedSilicaQuartzSub.heading1

fusedSilicaQuartzSub.overviewP1

fusedSilicaQuartzSub.overviewP2

fusedSilicaQuartzSub.calloutBox

fusedSilicaQuartzSub.heading2

fusedSilicaQuartzSub.gradeComparisonDesc

fusedSilicaQuartzSub.uvGradeBadge

UV-Grade (JGS1)

fusedSilicaQuartzSub.uvGradeSubtitle

Transmission @ 185nm > 90%
OH Content ~1,200 ppm
Impurity (Metals) < 1 ppm total
Best For UV Optics, Photomasks

fusedSilicaQuartzSub.uvGradeDesc

fusedSilicaQuartzSub.irGradeBadge

IR-Grade (JGS3)

fusedSilicaQuartzSub.irGradeSubtitle

Transmission @ 2.7μm > 85%
OH Content < 10 ppm
Impurity (Metals) 10–50 ppm
Best For IR Optics, Process Chambers

fusedSilicaQuartzSub.irGradeDesc

fusedSilicaQuartzSub.syntheticBadge

Synthetic Fused Silica

fusedSilicaQuartzSub.syntheticSubtitle

Transmission @ 193nm > 99.7%/cm
OH Content 800–1,200 ppm
Impurity (Metals) < 0.1 ppm
Best For DUV, Excimer Lasers

fusedSilicaQuartzSub.syntheticDesc

fusedSilicaQuartzSub.heading3

fusedSilicaQuartzSub.opticalPropertiesDesc

fusedSilicaQuartzSub.deepUvTitle

fusedSilicaQuartzSub.deepUvDesc

Key λ: 193nm (ArF) T > 99.7%/cm

fusedSilicaQuartzSub.nearIrTitle

fusedSilicaQuartzSub.nearIrDesc

Key λ: 1,550nm (Telecom) T > 92%

fusedSilicaQuartzSub.heading4

fusedSilicaQuartzSub.processingDesc

fusedSilicaQuartzSub.processingCmp

fusedSilicaQuartzSub.processingDicing

fusedSilicaQuartzSub.processingThinWafer

fusedSilicaQuartzSub.heading5

fusedSilicaQuartzSub.photomaskP1

fusedSilicaQuartzSub.photomaskP2

fusedSilicaQuartzSub.heading6

ParameterAvailable Range / Values
Material Grade UV-grade (JGS1), IR-grade (JGS3), Synthetic Fused Silica
Diameter 100mm (4″), 150mm (6″), 200mm (8″), 300mm (12″)
Thickness 200μm–1100μm, custom ±10μm tolerance
Surface Roughness RMS < 0.5nm standard, < 0.3nm premium
TTV (Total Thickness Variation) ≤ 3μm standard, ≤ 1μm premium
Bow / Warp Bow ≤ 20μm, Warp ≤ 25μm
Transmission @ 185nm > 90% UV-grade, > 85% standard
Refractive Index n₅₈₉ = 1.4585
CTE (Coefficient of Thermal Expansion) 0.55 × 10⁻⁶/K (20–300°C), nearly zero thermal expansion
Dielectric Constant 3.8 at 1 MHz
Softening Point ~1,600°C (synthetic fused silica)
Density 2.20 g/cm³
Surface Quality S/D 40/20 per MIL-PRF-13830B or better
Packaging Class 100 cleanroom, interleaved, vacuum-sealed cassette or single-wafer shippers

fusedSilicaQuartzSub.heading7

🔬

fusedSilicaQuartzSub.appPhotomasks

fusedSilicaQuartzSub.appPhotomasksDesc

💡

fusedSilicaQuartzSub.appExcimer

fusedSilicaQuartzSub.appExcimerDesc

🧬

fusedSilicaQuartzSub.appBioMems

fusedSilicaQuartzSub.appBioMemsDesc

〰️

fusedSilicaQuartzSub.appFiberOptic

fusedSilicaQuartzSub.appFiberOpticDesc

fusedSilicaQuartzSub.appCapacitiveMems

fusedSilicaQuartzSub.appCapacitiveMemsDesc

🔭

fusedSilicaQuartzSub.appPrecisionOptics

fusedSilicaQuartzSub.appPrecisionOpticsDesc

fusedSilicaQuartzSub.heading8

fusedSilicaQuartzSub.metrologyDesc

fusedSilicaQuartzSub.metrologySpectrophotometry fusedSilicaQuartzSub.metrologySpectrophotometryDesc
fusedSilicaQuartzSub.metrologyAfm fusedSilicaQuartzSub.metrologyAfmDesc
fusedSilicaQuartzSub.metrologyInterferometry fusedSilicaQuartzSub.metrologyInterferometryDesc
fusedSilicaQuartzSub.metrologyParticle fusedSilicaQuartzSub.metrologyParticleDesc
fusedSilicaQuartzSub.metrologyXrf fusedSilicaQuartzSub.metrologyXrfDesc
fusedSilicaQuartzSub.metrologyFtir fusedSilicaQuartzSub.metrologyFtirDesc
fusedSilicaQuartzSub.metrologyLidt fusedSilicaQuartzSub.metrologyLidtDesc
fusedSilicaQuartzSub.metrologyBirefringence fusedSilicaQuartzSub.metrologyBirefringenceDesc

fusedSilicaQuartzSub.ctaHeading

fusedSilicaQuartzSub.ctaDesc

ISO 9001:2015 SEMI MF1530 MIL-PRF-13830B ISO 21254 (LIDT)