מצעים
תהליכי MEMS
עיבוד מחדש
אביזרים
משאבים
חברה
חנות
Monocrystalline silicon ingot with polished surface
Bulk Supply of Silicon Ingots

Silicon Ingots Bulk Sales

Bulk CZ/MCZ/FZ/Poly silicon ingots in diameters 100–450mm with 9N–11N purity (CZ/FZ) and 6N–7N (Poly). Available with CoA and SEMI-grade documentation.

9N–11NPurity
100–450mmDiameter
CZ/MCZ/FZGrowth Method
0.001–10,000+ Ω·cmResistivity Range
01 — Bulk Supply

Bulk Silicon Ingot Supply

GINECHIP supplies CZ, MCZ, FZ & polycrystalline silicon ingots. Available for diameters 100–450 mm and purity 9N–11N (N / P / intrinsic). Ingot length ranges from 200–2000 mm, with full CoA and conformity to SEMI standards.

Polycrystalline solar-grade silicon ingots (6N–7N) for cost-efficient photovoltaic production. Single-crystal silicon ingots support logic, memory, power and RF devices. N-type (P/As/Sb), P-type (B), and intrinsic FZ are available.

Every silicon ingot includes a complete CoA, crystal quality data, and traceability records; custom ingot lengths and specifications are available on request.
Czochralski crystal puller drawing a silicon ingot from molten silicon
CZ crystal puller · 100–450mm diameter
02 — Growth Methods

Growth Methods

We supply silicon ingots produced by four mainstream technologies: CZ, MCZ, FZ, and polycrystalline. Each route offers different trade-offs in cost, purity, and oxygen content.

Industry Standard

CZ (Czochralski)

Most widely used growth method. CZ growth is a widely adopted method for producing silicon ingots with strong process maturity, reliable control of key crystal parameters and large-scale manufacturing. Choose CZ when you need proven yield and broad availability for wafer production.

  • Diameter: 100mm – 450mm
  • O₂ Content: 12 – 18 ppma
  • Resistivity: 0.001 – 100 Ω·cm
  • Cost: $ – $$
Controlled O₂ Content

MCZ (Magnetic CZ)

Oxygen incorporation is tunable. MCZ delivers tighter oxygen management compared with conventional CZ. By using magnetic fields during growth, it helps tailor oxygen incorporation and support stable crystal quality. Ideal when you need controlled oxygen levels at scale.

  • Diameter: 150mm – 300mm
  • O₂ Content: 6 – 12 ppma
  • Resistivity: 0.01 – 200 Ω·cm
  • Cost: $$ – $$$
Highest Purity

FZ (Float Zone)

No crucible-contact pollution. FZ growth produces silicon without the typical crucible contact, helping minimize container-related contamination. Choose FZ when ultra-low contamination and maximum electrical performance matter.

  • Diameter: 100mm – 200mm
  • O₂ Content: < 0.1 ppma
  • Resistivity: 1 – 10,000+ Ω·cm
  • Cost: $$$ – $$$$
02.1 — Method Comparison

Method Comparison

Choose the growth method based on your target device and manufacturing priorities: cost-focused selection with CZ, low-oxygen requirements with MCZ, and ultra-high purity needs with FZ.

CZ (Czochralski) — 100–450mm

Mature, widely adopted process with Oxygen content: 12–18 ppma and Resistivity: 0.001–100 Ω·cm. Ideal for high-volume production of logic and power devices.

  • Best for: Logic / Memory / Power
  • O₂: 12–18 ppma

MCZ Magnetic-Field Czochralski (150–300mm)

MCZ uses a magnetic field to suppress melt convection, enabling stable crystal growth and tighter oxygen content control for consistent bulk silicon ingots.

  • High-throughput bulk production with controlled oxygen levels
  • O₂: 6 – 12 ppma

FZ Float-Zone Silicon Ingots (100–200mm)

FZ (floating zone) grows silicon without a crucible, enabling the highest purity and excellent material quality for demanding processes.

  • Ultra-high purity needs where maximum cleanliness is critical
  • O₂: < 0.1 ppma
Stack of square multicrystalline silicon ingot blocks
156mm × 156mm square multicrystalline ingot
03 — Multicrystalline

Multicrystalline Silicon Ingot

Batch supply of multicrystalline silicon ingots made by casting. Suitable for solar-grade applications and high-purity requirements with polycrystalline purity 6N–7N.

Featuring 156mm × 156mm square ingots, this product delivers strong cost performance for multicrystalline wafer production — ideal when you want cost advantage in planning.

04 — Yield & Economics

Yield & Economics

Typical wafer yield estimates by ingot diameter, including saw kerf loss (180–200 μm, 160–180 μm, 140–160 μm depending on diameter).

Ingot diameterWafer count per 10 cmWafer count per full ingotSaw kerf loss
150mm (6″)~66~1,300180 – 200 μm
200mm (8″)~49~1,000180 – 200 μm
300mm (12″)~33~660160 – 180 μm
450mm (18″)~22~440140 – 160 μm
05 — Solar vs Semiconductor

Solar-grade vs Semiconductor-grade

Choose the right silicon ingot for your process — high-purity semiconductor-grade for ICs, or cost-effective solar-grade for PV.

Semiconductor-grade

9N–11N high-purity silicon ingots designed for IC applications, with low defects via Dash technology.

  • Purity: 9N–11N
  • No dislocations: Dash technique

Solar-grade mono-crystalline

CZ mono-crystalline solar silicon ingots for stable PV production and efficient cell manufacturing.

  • Diameter: 100–450mm
  • High-efficiency cells

Solar-grade poly-crystalline

Cast poly-crystalline solar silicon ingots — value focused for cost-effective PV manufacturing.

  • Purity: 6N–7N
  • Bar: 156mm×156mm
06 — Quality & Certifications

Quality & Certifications

Bulk sales with traceable documentation — ISO 9001:2015, aligned with SEMI standards, and delivered with CoA for each ingot.

FTIR gap oxygen & carbonMeasures interstitial oxygen and carbon content using FTIR.
Four-point probe resistivity mapMaps resistivity distribution by four-point probe measurement.
FZ minority carrier lifetimeTests FZ minority carrier lifetime to confirm >1,000 μs.
XRD dislocation density analysisUses X-ray diffraction to analyze dislocation density.
Surface defect inspection & scanPerforms visual inspection and scanning to detect surface defects.
Diameter & length geometry metrologyVerifies diameter, length, and flat alignment for each ingot.
Etch pit density (EPD)Measures etch pit density (EPD) to evaluate defect-related parameters.
CoA & batch traceabilityProvides full CoA documentation and batch traceability for each shipment.
Technician inspecting a silicon ingot with a precision measurement instrument
Metrology & traceability · each ingot complete CoA
07 — Technical Specifications

Technical Specifications

ParameterSpecification
Growth MethodCZ (Czochralski), MCZ (Magnetic CZ), FZ (Float Zone), Multicrystalline (cast)
Diameter100mm, 125mm, 150mm, 200mm, 300mm, 450mm
Length200mm – 2000mm, custom lengths available
Dopant / TypeN-type (P, As, Sb), P-type (B), Intrinsic (FZ)
Resistivity0.001 – 10,000+ Ω·cm, application-dependent
Crystal Orientation〈100〉, 〈111〉, 〈110〉, off-cut available
Purity9N – 11N (CZ/FZ), 6N – 7N (multicrystalline)
Oxygen ContentCZ: 12 – 18 ppma, MCZ: 6 – 12 ppma, FZ: < 0.1 ppma
Carbon ContentCZ: ≤ 0.1 ppma, FZ: < 0.05 ppma
LifetimeFZ: > 1,000 μs minority carrier lifetime
Dislocation DensityCZ: dislocation-free (Dash technique), Multi: 10³ – 10⁶/cm²
Ingot ShapeCylindrical, square (156mm × 156mm for solar), rectangular
Edge RoundingGround, etched, as-cut
Surface FinishAs-grown, ground, etched, polished crown
PackagingWooden crate, foam-lined, vacuum-sealed, shock-resistant
08 — Application Areas

Application Areas

AI Chips

High-purity CZ/FZ silicon ingots for stable wafer production and reliable performance in AI and neural network accelerators, across 0.001 to 10,000+ Ω·cm.

Power Devices

Silicon ingots for power semiconductor manufacturing, supporting power management and power electronics. CZ/FZ 9N–11N and poly 6N–7N purity.

Solar PV

156mm×156mm solar-grade silicon ingots for photovoltaic cell production, with 0.001–10,000+ Ω·cm design flexibility.

MEMS

Silicon ingots for MEMS sensor and actuator fabrication, enabling consistent wafer quality for micromachined devices.

RF/Analog

High-purity silicon ingots support RF and analog wafers with stable electrical performance across a wide resistivity range.

Comms Equipment

Silicon ingots for communication devices enable reliable wafer fabrication for 5G and general transceiver applications.

Scientific Instruments

For detector and precision measurement wafers, high-purity silicon provides a strong foundation for performance and repeatability.

LED & Optoelectronics

Silicon ingots support consistent wafer processing for light-emitting and photodetector applications.

09 — Bulk Pricing

Bulk Pricing

High volume = better value. Quantity-based pricing is negotiable with a short lead time.

Polysilicon Ingot (Multi-Crystalline)

Solar-grade material with the lowest unit price, optimized for cost efficiency.

  • Purity: 6N–7N
  • Size: 156mm × 156mm square ingot

CZ Silicon Ingot

Suitable for both IC and solar applications — balanced performance and cost-effectiveness.

  • Diameter: 100–450mm
  • O₂: 12–18 ppma · Cost: $–$$

FZ Silicon Ingot

Highest purity choice for high-end applications, designed for demanding manufacturing.

  • Purity: 9N–11N · O₂: <0.1 ppma
  • Cost: $$$–$$$$
10 — Supply Chain & Lead Time

Supply Chain & Lead Time

Stable Supply

Stable supply backed by capacity planning for bulk silicon ingot needs — designed to support continuous production schedules.

Protected Logistics

Careful logistics and protection: wood crate, foam, vacuum sealing, and anti-vibration handling to safeguard material integrity.

Transparent Lead Time

Transparent lead time support with inventory coordination, helping you plan procurement with confidence for production continuity.

Custom Specifications

Need custom dimensions or specific specs? We'll help match your requirements and coordinate the right supply plan.

Bulk demand? Request a quote

Tell us your quantity, destination, and packaging preference — we'll respond with lead-time and pricing options for silicon ingot bulk orders.

ISO 9001:2015 SEMI M1–M13 Each ingot complete CoA RoHS / REACH